uah p 17030

Docket: UAH-P-17030


Counterfeit electronic components have become more prevalent with more systems requiring electronic components such as Flash memory. Counterfeit components are often recycled components, which do not have the same levels of performance that a new component would have. Current methods of detecting counterfeit components are very difficult and require built-in hardware components or large databases of information.

Researchers at UAH have developed a method for detecting counterfeit Flash memory using the timing characteristics of Flash memory and the number of faulty bits. This method measures the program and erase time of the memory in question, and compares it with measurements from a known legitimate unit. A counterfeit, used, or fake unit will have longer erase times and higher faulty bits, when compared to a known good unit.

Counterfeit units have lower performance and less longevity than real units do. Potentially reduced performance or early system failure is possible with counterfeit units. This technology developed at UAH creates a simple way to test Flash memory and determine if it is legitimate. Testing products negates the possibility of lowered performance or early system failure due to counterfeits. Lowered performance could be an issue for a large manufacturer who may have to recall thousands of units, and early system failure of a critical system such as military or aircraft electronics could result in fatalities.


  • Smartphones
  • Electronics manufacturers
  • Military electronics


  • Cost effective
  • Non-destructive
  • No database required
  • Reliable
  • Fast


  • State of Development: Prototype
  • Licensing Status: Available for licensing
  • Patent Status: Patent pending